Apparatus and Method for the Analysis of Particle Characteristics using Monotonically Scattered light.
Kaye, P.& Hirst, E.28 Nov 1995 US5471299Research output: Patent
| Original language | English |
|---|---|
| Publication date | 28 Nov 1995 |
| Patent number | US5471299 |
| IPC | PCT/393,003,317 |
| State | Published |